Opening book details…
About this Materials Science article
Measurement of attraction force between AFM tip and surface of dielectric thin films with DC-bias by Y.F. Zhu; C.H. Xu; B. Wang; C.H. Woo is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Y.F. Zhu; C.H. Xu; B. Wang; C.H. Woo
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0927-0256)
- Published
- 2005
- Field
- Materials Science (Physical Sciences)