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A Reliability Factor for Surface Structure Determinations by Low-energy Electron Diffraction by E. Zanazzi; F. Jona is a Physics and Astronomy article available to read on EtoBox.

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Surface structure determination by LEED (low-energy electron dlffracUon) is usually based on visual evaluaUon of the correspondence between calculated and observed intensity spectra. After a critique of the wsual-evaluatlon method and of several criteria that have been proposed to replace it, a definition as given for a rehabthty lactor r for a single beam, which purports to have almost all advantages of the visual criterion but not Its disadvantages. A convement quantity is the reduced r-factor r r = r/)-random x~hereT-random Is the average value oft for a randomly chosen pair of curves. The reduced r factor is calculated for more than 100 beams trom 7 different surface structures and a darect relationship is estabhshed between the language of xasual evaluanon and the numerical values of r r. Next, a reliabthty factor R for a number of beams is defined and tested -the result being a scale of values with which to measure the credlbdlty oI a given model m surface structure analysis. Plots o! R versus non-structural and structural parameters allow objective and rehable choice of the "'correct" model, especially when a large number of beams are avadable for testang.

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Author

E. Zanazzi; F. Jona

Publisher

Elsevier BV

Published

1977

Language

EN

Field

Physics and Astronomy (Physical Sciences)