About this scholarly article

2010 27th International Conference on Microelectronics Proceedings - Degradation of p-channel power VDMOSFETs under pulsed NBT stress by Djoric-Veljkovic, S.; Dankovic, D.; Prijic, A.; Manic, I.; Davidovic, V.; Golubovic, S.; Prijic, Z.; Stojadinovic, N. is a scholarly article available to read on EtoBox.

Author

Djoric-Veljkovic, S.; Dankovic, D.; Prijic, A.; Manic, I.; Davidovic, V.; Golubovic, S.; Prijic, Z.; Stojadinovic, N.

Publisher

IEEE

Published

2010