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About this Engineering article
Parasitic-free Measurement of the Fundamental Frequency Response of a Semiconductor Laser by Active-layer Photomixing by M. A. Newkirk; K. J. Vahala is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- M. A. Newkirk; K. J. Vahala
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1988
- Field
- Engineering (Physical Sciences)