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Can I read AFM studies on ZnS thin films grown by atomic layer epitaxy on EtoBox?
AFM studies on ZnS thin films grown by atomic layer epitaxy by Jarkko Ihanus; Mikko Ritala; Markku Leskelä; Thomas Prohaska; Roland Resch; Gernot Friedbacher; Manfred Grasserbauer is a Materials Science article available to read on EtoBox.
What is AFM studies on ZnS thin films grown by atomic layer epitaxy about?
## Ž . Polycrystalline ZnS films were grown from ZnCl and H S on glass and mica using the atomic layer epitaxy ALE 2 2 technique. Morphological and crystalline changes during the ALE growth of ZnS were studied by AFM and XRD. AFM measurements revealed that substantial agglomeration took place in the beginning of the growth. On glass the nucleation density of ZnS was higher than on mica and consequently the films on glass remained smoother than those on mica. XRD measurements revealed that orientation of the films was stronger on mica than on glass. q 1997 Elsevier Science B.V.
Who reads AFM studies on ZnS thin films grown by atomic layer epitaxy?
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Jarkko Ihanus; Mikko Ritala; Markku Leskelä; Thomas Prohaska; Roland Resch; Gernot Friedbacher; Manfred Grasserbauer
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0169-4332)
- Published
- 1997
- Language
- EN
- Field
- Materials Science (Physical Sciences)