Opening book details…
About this Engineering article
Fabrication and Characterization of Buried Subchannel Implant N-metal–oxide–semiconductor Transistors by W. Wang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- W. Wang
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-211X)
- Published
- 1998
- Field
- Engineering (Physical Sciences)