About this scholarly article

SPIE Proceedings [SPIE Intl Conf on Fourier and Computerized Infrared Spectroscopy - Fairfax, VA (Monday 19 June 1989)] 7th Intl Conf on Fourier Transform Spectroscopy - FTIR External Reflection Study Of Molecular Orientation On Semiconductors by Mielczarski, Jerzy; Cameron, David G. is a scholarly article available to read on EtoBox.

Author

Mielczarski, Jerzy; Cameron, David G.

Publisher

SPIE

Published

1989