About this scholarly article

SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Process Control and Inspection for Industry - Automatic inspection of geometric accuracy of optical fiber ferrules by machine vision by Kim, Gee-Hong; Kim, Seung-Woo; Lim, SangGun; Zhang, Shulian; Gao, Wei is a scholarly article available to read on EtoBox.

Author

Kim, Gee-Hong; Kim, Seung-Woo; Lim, SangGun; Zhang, Shulian; Gao, Wei

Publisher

SPIE

Published

2000