About this scholarly article

Conference Digest Conference on Precision Electromagnetic Measurements - Extension of the IEN traceability for AC voltages below 200 mV by Pogliano, U.; Bosco, G.C.; D'Elia, V. is a scholarly article available to read on EtoBox.

Author

Pogliano, U.; Bosco, G.C.; D'Elia, V.

Publisher

IEEE

Published

2002