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Drop Test Analysis with ANSYS LS-DYNA by 施玟宇 is a document available to read on EtoBox.

What is Drop Test Analysis with ANSYS LS-DYNA about?

The document presents a methodology for conducting explicit drop tests using ANSYS LS-DYNA, focusing on a case study involving a mobile electronic device. It details the workflow for geometry preparation, meshing, and submodeling to achieve high-accuracy results efficiently. The results indicate that the submodeling techniques can effectively assess structural responses under nonlinear loading conditions.

Author

施玟宇

Language

EN