Opening book details…
About this Engineering article
Enhancement of Intragrain Critical Current Density in Bi-Based Superconductor by Substitutional Structural Defects by Tanaka, H.; Yoshikawa, H.; Tsuruta, C.; Matsui, Y.; Kishida, S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Tanaka, H.; Yoshikawa, H.; Tsuruta, C.; Matsui, Y.; Kishida, S.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1051-8223)
- Published
- 2011
- Language
- EN
- Field
- Engineering (Physical Sciences)
More by Tanaka, H.; Yoshikawa, H.; Tsuruta, C.; Matsui, Y.; Kishida, S.
Browse all works by Tanaka, H.; Yoshikawa, H.; Tsuruta, C.; Matsui, Y.; Kishida, S.