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About this Computer Science article
Probabilistic Risk Assessment of Tunneling-induced Damage to Existing Properties by Wang, Fan; Ding, L.Y.; Luo, H.B.; Love, Peter E.D. is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Wang, Fan; Ding, L.Y.; Luo, H.B.; Love, Peter E.D.
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0957-4174)
- Published
- 2014
- Language
- EN
- Field
- Computer Science (Physical Sciences)
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