About this scholarly article

2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Unified Characterization Platform for Emerging NVM Technology: Neural Network Application Benchmarking using off-the-Shelf NVM Chips by Chakraborty, Supriya; Gupta, Abhishek; Suri, Manan is a scholarly article available to read on EtoBox.

Author

Chakraborty, Supriya; Gupta, Abhishek; Suri, Manan

Publisher

IEEE

Published

2020