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Can I read Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials) on EtoBox?
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials) by Yasuo Cho is a nonfiction available to read on EtoBox.
What is Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials) about?
__Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices__ is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.
Who reads Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials)?
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Yasuo Cho
- Publisher
- Elsevier Science & Technology; Woodhead Publishing
- Published
- 2020
- Language
- EN
- ISBN
- 9780081028032
- Category
- nonfiction
- Subjects
- Engineering, Science, Stem
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