Opening book details…
About this Engineering article
Effects of High-level Free-carrier Injection on the Base Transit Time of Bipolar Junction Transistors by Y. Yue; J.J. Liou; A. Ortiz-Conde; F.Garcia Sanchez is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Y. Yue; J.J. Liou; A. Ortiz-Conde; F.Garcia Sanchez
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101)
- Published
- 1996
- Field
- Engineering (Physical Sciences)
More by Y. Yue; J.J. Liou; A. Ortiz-Conde; F.Garcia Sanchez
Browse all works by Y. Yue; J.J. Liou; A. Ortiz-Conde; F.Garcia Sanchez