About this scholarly article

Twenty Sixth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.00CH37146) - Yield prediction models for optimization of high-speed micro-processor manufacturing processes by Tae Seon Kim, ; Se Hwan Ahn, ; Young Gyun Jang, ; Jeong In Lee, ; Kil Jae Lee, ; Byeong Yun Kim, ; Chang Hyun Cho, is a scholarly article available to read on EtoBox.

Author

Tae Seon Kim, ; Se Hwan Ahn, ; Young Gyun Jang, ; Jeong In Lee, ; Kil Jae Lee, ; Byeong Yun Kim, ; Chang Hyun Cho,

Publisher

IEEE

Published

2000