Opening book details…
About this Materials Science article
Characterization of Optical Thin Films by Spectroscopic Ellipsometry by Susan Trolier-McKinstry; Pong Chindaudom; Kuppuswami Vedam; Basavaraj V. Hiremath is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Susan Trolier-McKinstry; Pong Chindaudom; Kuppuswami Vedam; Basavaraj V. Hiremath
- Publisher
- John Wiley and Sons; Wiley (Blackwell Publishing); Wiley-Blackwell; Wiley (ISSN 0002-7820)
- Published
- 1995
- Field
- Materials Science (Physical Sciences)