About this scholarly article

2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Thermal stability of Ni(Zr)Si silicide and Ni(Zr)Si/Si Schottky diode by Huang, Wei; Zhang, Lichun; Zhang, Shudan; Xu, Juyan is a scholarly article available to read on EtoBox.

Author

Huang, Wei; Zhang, Lichun; Zhang, Shudan; Xu, Juyan

Publisher

IEEE

Published

2010