About this scholarly article

Characterizing devices using the IEC 61000-4-5 surge stress by Marum, Steve (author);Kemper, Wolfgang (author);Lin, Yen Yi (author);Barker, Paul (author) is a scholarly article available to read on EtoBox.

Author

Marum, Steve (author);Kemper, Wolfgang (author);Lin, Yen Yi (author);Barker, Paul (author)

Published

2012