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2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) by Amat, E. (author);del Moral, A. (author);Klupfel, F. (author);Bausells, J. (author);Perez-Murano, F. (author) is a nonfiction available to read on EtoBox.
What is 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) about?
Carry out an electronic device/circuit at the scale of few nanometers usually implies a high level of uncertainty due to device variability along the fabrication process. In fact, hybrid SET-FET circuit can be extremely delicate in front of parasitic elements, due to the low level of current provided by the SET device. So, in this contribution and study of their influence is done. Moreover, the suitability to implement this circuit by using FinFET SOI is observed, as well.
Who reads 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)?
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Amat, E. (author);del Moral, A. (author);Klupfel, F. (author);Bausells, J. (author);Perez-Murano, F. (author)
- Publisher
- IEEE
- Published
- 2020
- Language
- EN
- Category
- nonfiction