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About this Engineering article
Methodology for the characterization and observation of filamentary spots in HfOx-based memristor devices by Poblador, Samuel; Maestro-Izquierdo, Marcos; Zabala, Miguel; González, Mireia B.; Campabadal, Francesca is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Poblador, Samuel; Maestro-Izquierdo, Marcos; Zabala, Miguel; González, Mireia B.; Campabadal, Francesca
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-9317)
- Published
- 2020
- Language
- EN
- Field
- Engineering (Physical Sciences)