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About this Engineering article
Synchrotron Investigations of Electronic and Atomic-structure Peculiarities for Silicon-oxide Films’ Surface Layers Containing Silicon Nanocrystals by V. A. Terekhov; S. Yu. Turishchev; K. N. Pankov; I. E. Zanin; E. P. Domashevskaya; D. I. Tetelbaum; A. N. Mikhailov; A. I. Belov; D. E. Nikolichev is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- V. A. Terekhov; S. Yu. Turishchev; K. N. Pankov; I. E. Zanin; E. P. Domashevskaya; D. I. Tetelbaum; A. N. Mikhailov; A. I. Belov; D. E. Nikolichev
- Publisher
- Pleiades Publishing; Pleiades Publishing Ltd (ISSN 1027-4510)
- Published
- 2011
- Language
- EN
- Field
- Engineering (Physical Sciences)