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About this Engineering article

Study of the uniformity and stoichiometry of CoSi2 films using Rutherford backscattering spectroscopy and scanning electron microscopy by Ishibashi, Kouichirou is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Ishibashi, Kouichirou
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
1983
Field
Engineering (Physical Sciences)

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