Opening book details…
About this Engineering article
On-line hazard aversion: a Bayes approach : Jonathan S. Tan and Mark A. Kramer. IEEE Transactions on Reliability, 42(2), 317 (June 1993) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1994
- Field
- Engineering (Physical Sciences)