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About this scholarly article
Proceedings of 1994 IEEE International Electron Devices Meeting - Simulation of advanced field isolation using calibrated viscoelastic stress analysis by Senez, V.; Collard, D.; Ferreira, P.; Baccus, B. is a scholarly article available to read on EtoBox.
- Author
- Senez, V.; Collard, D.; Ferreira, P.; Baccus, B.
- Publisher
- IEEE
- Published
- 1994
- Language
- EN
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