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The document describes the development of the Positive and Negative Syndrome Scale (PANSS) for assessing schizophrenia. It was developed to address limitations of prior scales by providing balanced and operationalized measurement of positive and negative symptoms, their severity, and their relationship to global psychopathology. The PANSS was standardized based on interviews of 101 schizophrenic patients. Initial results found the PANSS scales to be reliable and supported their construct validity based on c
- Author
- lucicoso
- Language
- EN