About this scholarly article

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2013) - Beijing, China (Sunday 17 November 2013)] 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Spot image based multi-field wavefront retrieval by Chen, Xinhua; Shen, Weimin; Tam, Hwa-Yaw; Xu, Kexin; Xiao, Hai; Zhu, Jigui; Zhao, Chun-Liu is a scholarly article available to read on EtoBox.

Author

Chen, Xinhua; Shen, Weimin; Tam, Hwa-Yaw; Xu, Kexin; Xiao, Hai; Zhu, Jigui; Zhao, Chun-Liu

Publisher

SPIE

Published

2013