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About this Engineering article

Influence of Oxygen and Boron on Defect Production in Irradiated Silicon by Drevinsky, P. J.; Caefer, C. E.; Tobin, S. P.; Mikkelsen, J. C.; Kimerling, L. C. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Drevinsky, P. J.; Caefer, C. E.; Tobin, S. P.; Mikkelsen, J. C.; Kimerling, L. C.
Publisher
Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
Published
1987
Language
EN
Field
Engineering (Physical Sciences)

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