About this scholarly article

2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Hot carrier reliability in GaAs PHEMT MMIC power amplifiers by Chou, Y.C.; Gnundbacher, R.; Lai, R.; Li, G.P.; Kan, Q.; Yu, M.; Callejo, L.; Leung, D.; Eng, D.; Block, T.; Oki, A. is a scholarly article available to read on EtoBox.

Author

Chou, Y.C.; Gnundbacher, R.; Lai, R.; Li, G.P.; Kan, Q.; Yu, M.; Callejo, L.; Leung, D.; Eng, D.; Block, T.; Oki, A.

Publisher

IEEE

Published

2005