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About this Earth and Planetary Sciences article
Trace element diffusion in rhyolitic melts: comparison between synchrotron radiation X-ray fluorescence microanalysis (μ-SRXRF) and secondary ion mass spectrometry (SIMS) by Hahn, Matthias; Behrens, Harald; Tegge-Schüring, Astrid; Koepke, Jürgen; Horn, Ingo; Rickers, Karen; Falkenberg, Gerald; Wiedenbeck, Michael is a Earth and Planetary Sciences article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Earth and Planetary Sciences.
- Author
- Hahn, Matthias; Behrens, Harald; Tegge-Schüring, Astrid; Koepke, Jürgen; Horn, Ingo; Rickers, Karen; Falkenberg, Gerald; Wiedenbeck, Michael
- Publisher
- E. Schweizerbart Science Publishers; Schweizerbart; E. Schweizerbart'sche Verlagsbuchhandlung (ISSN 0935-1221)
- Published
- 2005
- Language
- EN
- Field
- Earth and Planetary Sciences (Physical Sciences)