About this scholarly article

2009 IEEE International Symposium on Electromagnetic Compatibility - Transient-to-digital converter for protection design in CMOS integrated circuits against electrical fast transient by Yen, Cheng-Cheng; Ker, Ming-Dou; Liao, Chi-Sheng; Chen, Tung-Yang; Tsai, Chih-Chung is a scholarly article available to read on EtoBox.

Author

Yen, Cheng-Cheng; Ker, Ming-Dou; Liao, Chi-Sheng; Chen, Tung-Yang; Tsai, Chih-Chung

Publisher

IEEE

Published

2009

Language

EN