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About this Earth and Planetary Sciences article
Reducing Scanning Electron Microscope Charging by Using Exponential Contrast Stretching Technique on Post‐processing Images by K.S. SIM; Y.Y. TAN; M.A. LAI; C.P. TSO; W.K. LIM is a Earth and Planetary Sciences article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Earth and Planetary Sciences.
- Author
- K.S. SIM; Y.Y. TAN; M.A. LAI; C.P. TSO; W.K. LIM
- Publisher
- John Wiley and Sons; Wiley (Blackwell Publishing); Blackwell Publishing Inc.; Wiley-Blackwell Publishing Ltd; Wiley (ISSN 0022-2720)
- Published
- 2010
- Field
- Earth and Planetary Sciences (Physical Sciences)
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