About this scholarly article

SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Extending the application of subaperture finishing by Tricard, Marc; Hou, Xun; Yuan, Jiahu; Shorey, Aric; Dumas, Paul; Wyant, James C.; Wang, Hexin; Demarco, Mike; Han, Sen is a scholarly article available to read on EtoBox.

Author

Tricard, Marc; Hou, Xun; Yuan, Jiahu; Shorey, Aric; Dumas, Paul; Wyant, James C.; Wang, Hexin; Demarco, Mike; Han, Sen

Publisher

SPIE

Published

2006