About this scholarly article

SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Effect of surface roughness on the measurement of high power laser with a cone-shaped cavity by Wang, Lei; Hou, Xun; Yuan, Jiahu; Yang, Zhaojin; Li, Gaoping; Wyant, James C.; Wang, Hexin; Liang, Yanxi; Han, Sen is a scholarly article available to read on EtoBox.

Author

Wang, Lei; Hou, Xun; Yuan, Jiahu; Yang, Zhaojin; Li, Gaoping; Wyant, James C.; Wang, Hexin; Liang, Yanxi; Han, Sen

Publisher

SPIE

Published

2006