About this scholarly article
SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Soft X-Ray Microscopy - X-ray microscopy studies with the Goettingen x-ray microscopes by Guttmann, Peter; Schneider, Gerd; Thieme, Juergen; David, Christian; Diehl, Michael; Medenwaldt, Robin; Niemann, Bastian; Rudolph, Dietbert M.; Schmahl, Guenther A.; Jacobsen, Chris J.; Trebes, James E. is a scholarly article available to read on EtoBox.
- Author
- Guttmann, Peter; Schneider, Gerd; Thieme, Juergen; David, Christian; Diehl, Michael; Medenwaldt, Robin; Niemann, Bastian; Rudolph, Dietbert M.; Schmahl, Guenther A.; Jacobsen, Chris J.; Trebes, James E.
- Publisher
- SPIE
- Published
- 1993
- Language
- EN