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Impact of air exposure on the chemical and electronic structure of ZnO:Zn3N2 thin films by Bär, M. ;Ahn, K.-S. ;Shet, S. ;Yan, Y. ;Weinhardt, L. ;Fuchs, O. ;Blum, M. ;Pookpanratana, S. ;George, K. ;Yang, W. ;Denlinger, J. D. ;Al-Jassim, M. ;Heske, C. is a Engineering article available to read on EtoBox.

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Author
Bär, M. ;Ahn, K.-S. ;Shet, S. ;Yan, Y. ;Weinhardt, L. ;Fuchs, O. ;Blum, M. ;Pookpanratana, S. ;George, K. ;Yang, W. ;Denlinger, J. D. ;Al-Jassim, M. ;Heske, C.
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
2009
Field
Engineering (Physical Sciences)

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