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About this scholarly article
International Conference on Molecular Bean Epitaxy - The effect of (NH/sub 4/)/sub 2/S passivation treatments on the dark current-voltage characteristics of InGaAsSb PIN detector by Zhang, X.; Li, A.Z.; Lin, C.; Xu, G.Y. is a scholarly article available to read on EtoBox.
- Author
- Zhang, X.; Li, A.Z.; Lin, C.; Xu, G.Y.
- Publisher
- IEEE
- Published
- 2002
- Language
- EN