About this scholarly article

AIP Conference Proceedings [AIP THIRD MANUFACTURING ENGINEERING SOCIETY INTERNATIONAL CONFERENCE: MESIC-09 - Alcoy (Spain) (17–19 June 2009)] - Traceability In The Calibration Of Low Cost Opto-Electronic Sensors For Measuring 2D Displacement by Yagüe, J. A.; Aguilar, J. J.; Valenzuela, M.; Lope, M. A.; Segui, Vicente Jesus is a scholarly article available to read on EtoBox.

Author

Yagüe, J. A.; Aguilar, J. J.; Valenzuela, M.; Lope, M. A.; Segui, Vicente Jesus

Publisher

AIP

Published

2009