About this scholarly article

2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC) - Reduced-Code Techniques for On-Chip Static Linearity Test of SAR ADCs by Feitoza, Renato S.; Barragan, Manuel J.; Mir, Salvador is a scholarly article available to read on EtoBox.

Author

Feitoza, Renato S.; Barragan, Manuel J.; Mir, Salvador

Publisher

IEEE

Published

2019