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About this Engineering article
From Local to Global Analysis of Defect Detectability in Infrared Non-destructive Testing by Florez-Ospina, J.F.; Benitez, H.D. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Florez-Ospina, J.F.; Benitez, H.D.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 1350-4495)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)