About this scholarly article

2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Air-Gap Application and Simulation Results for Low Capacitance in 60nm NAND Flash Memory by Kim, Sukjoong; Cho, Wheewon; Kim, Junggeun; Lee, Byungseok; Park, Sungki is a scholarly article available to read on EtoBox.

Author

Kim, Sukjoong; Cho, Wheewon; Kim, Junggeun; Lee, Byungseok; Park, Sungki

Publisher

IEEE

Published

2007

Language

EN