About this scholarly article

International Technical Digest on Electron Devices - Reliability design of p/sup +/-pocket implant LDD transistors by Duvvury, C.; Holloway, T.C.; Paradis, D.; Duong, A.K. is a scholarly article available to read on EtoBox.

Author

Duvvury, C.; Holloway, T.C.; Paradis, D.; Duong, A.K.

Publisher

IEEE

Published

1990

Language

EN