About this scholarly article

SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Process Control and Inspection for Industry - High-precision measurement of the wavelength shift of in-fiber Bragg grating with strain gauge by Xie, Fang; Zhang, Shulian; Li, Yan; Zhang, Aihua; Lee, Sang Bae; Zhang, Shulian; Gao, Wei is a scholarly article available to read on EtoBox.

Author

Xie, Fang; Zhang, Shulian; Li, Yan; Zhang, Aihua; Lee, Sang Bae; Zhang, Shulian; Gao, Wei

Publisher

SPIE

Published

2000

Language

EN