About this Engineering article
Thickness Dependent X-Ray and Raman Studies of PrMnO3 Thin Films by Chaturvedi, Aditi (author);Sathe, V. G. (author) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chaturvedi, Aditi (author);Sathe, V. G. (author)
- Publisher
- EJournal Publishing
- Published
- 2014
- Field
- Engineering (Physical Sciences)