Can I read Self-Checking and Fault-Tolerant Digital Design (The Morgan Kaufmann Series in Computer Architecture and Design) on EtoBox?

Self-Checking and Fault-Tolerant Digital Design (The Morgan Kaufmann Series in Computer Architecture and Design) by Lala, Parag K., 1948- is a book available to read on EtoBox.

What is Self-Checking and Fault-Tolerant Digital Design (The Morgan Kaufmann Series in Computer Architecture and Design) about?

<p>With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation.</p> <p><i>Self-Checking and Fault-Tolerant Digital Design</i> deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems.</p> <p>* Introduces reliability theory and the importance of maintainability<br> * Presents coding and the construction of several error detecting and correcting codes<br> * Discusses in depth, the available techniques for fail-safe design of combinational circuit

Author

Lala, Parag K., 1948-

Publisher

San Francisco: Morgan Kaufmann

Published

2001

Language

EN

ISBN

9780124343702

Subjects

Computer Science, Engineering, Reference

Rating

3.5 / 5 (2 ratings)

Updated

2026-03-14