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About this scholarly article
2008 IEEE International Reliability Physics Symposium - Novel hot-carrier AC-DC design guidelines for advanced CMOS nodes by Guerin, C.; Huard, V.; Parthasarathy, C.; Roux, J.M.; Bravaix, A.; Vincent, E. is a scholarly article available to read on EtoBox.
- Author
- Guerin, C.; Huard, V.; Parthasarathy, C.; Roux, J.M.; Bravaix, A.; Vincent, E.
- Publisher
- IEEE
- Published
- 2008
- Language
- EN
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