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About this Engineering article
Evolution Of Defects Induced By High Energy He Implantation In Gold-Diffused Silicon by Bouayadi, R. El; Regula, G.; Pichaud, B.; Lancin, M.; Simon, J. J.; Ntsoenzok, E. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Bouayadi, R. El; Regula, G.; Pichaud, B.; Lancin, M.; Simon, J. J.; Ntsoenzok, E.
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 2001
- Language
- EN
- Field
- Engineering (Physical Sciences)