About this scholarly article

Proceedings. International Test Conference 1990 - Why is less information from logic simulation more useful in fault simulation? by Akers, S.B.; Park, S.; Krishnamurthy, B.; Swaminathan, A. is a scholarly article available to read on EtoBox.

Author

Akers, S.B.; Park, S.; Krishnamurthy, B.; Swaminathan, A.

Publisher

IEEE Comput. Soc. Press

Published

1990