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About this Engineering article
Probabilistic Assessment of Equipment Trips due to Voltage Sags by Gupta, C.P.; Milanovic, J.V. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Gupta, C.P.; Milanovic, J.V.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; ScienceOpen; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0885-8977)
- Published
- 2006
- Field
- Engineering (Physical Sciences)