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About this scholarly article
2007 Proceedings 57th Electronic Components and Technology Conference - Stacking Dies: Combined Virtual Prototyping and Reliability Testing Based Design Rules by Real, R. A.; van Driel, W.D.; Yang, D.G.; Zhang, G.Q.; Pasion, J. is a scholarly article available to read on EtoBox.
- Author
- Real, R. A.; van Driel, W.D.; Yang, D.G.; Zhang, G.Q.; Pasion, J.
- Publisher
- IEEE
- Published
- 2007
- Language
- EN
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